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Issue No. 02 - March/April (2004 vol. 21)
ISSN: 0740-7475
pp: 77-78
Rajesh Gupta , Editor in Chief, <em>IEEE Design & Test</em>
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CITATION
Rajesh Gupta, "Past successes, future challenges", IEEE Design & Test of Computers, vol. 21, no. , pp. 77-78, March/April 2004, doi:10.1109/MDT.2004.1277897
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