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Issue No. 01 - January/February (vol. 21)
ISSN: 0740-7475

IEEE Design & Test (PDF)

pp. C1

New for 2004 (PDF)

pp. C2
EIC Message

Predictability in Design and Manufacturing (HTML)

Rajesh Gupta , Editor in Chief, <em>IEEE Design & Test</em>
pp. 1

Guest Editors' Introduction: RTL to GDSII--From Foilware to Standard Practice (HTML)

Dwight Hill , Synopsys
Andrew B. Kahng , University of California, San Diego
pp. 9-12

An Integrated Environment for Technology Closure of Deep-Submicron IC Designs (Abstract)

Louise Trevillyan , IBM T.J. Watson Research Center
David Kung , IBM T.J. Watson Research Center
Ruchir Puri , IBM T.J. Watson Research Center
Lakshmi N. Reddy , IBM Microelectronics Division
Michael A. Kazda , IBM Microelectronics Division
pp. 14-22

Crosstalk-Aware Placement (Abstract)

Jinan Lou , Synopsys
Wei Chen , Synopsys
pp. 24-32
Nontheme Features

Efficient and Economical Test Equipment Setup Using Procorrelation (Abstract)

Bin-Hong Lin , Intellectual Property Library Co.
Cheng-Wen Wu , National Tsing Hua University
Hwei-Tsu Ann Luh , Taiwan Semiconductor Manufacturing Co.
pp. 34-43

Seamless Test of Digital Components in Mixed-Signal Paths (Abstract)

Sule Ozev , Duke University
Ismet Bayraktaroglu , Sun Microsystems
Alex Orailoglu , University of California, San Diego
pp. 44-55

Panel Summaries (HTML)

Hans-Joachim Wunderlich , University of Stuttgart
Sandeep K. Shukla , Virginia Tech
pp. 65-66
The Last Byte

Paperless Design and Test (Abstract)

Scott Davidson , Sun Microsystems
pp. 72
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