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Issue No. 01 - January/February (2004 vol. 21)
ISSN: 0740-7475
pp: 56-63
Kaushik Roy , Purdue University
ABSTRACT
<p>Two CMOS design techniques use dual threshold voltages to reduce power consumption while maintaining high performance. Simulation results show power savings of 21% for one technique at low activity, and for the other, 19% at high activity and 38% at low activity.</p>
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CITATION
Kaushik Roy, Naran Sirisantana, "Low-Power Design Using Multiple Channel Lengths and Oxide Thicknesses", IEEE Design & Test of Computers, vol. 21, no. , pp. 56-63, January/February 2004, doi:10.1109/MDT.2004.1261850
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