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Issue No.01 - January/February (2004 vol.21)
pp: 44-55
Sule Ozev , Duke University
Ismet Bayraktaroglu , Sun Microsystems
Alex Orailoglu , University of California, San Diego
<p>For today's large, mixed-signal designs, test generation requires propagating signals through digital and analog modules. This article offers an innovative seamless approach that defines a digital test methodology for digital modules wherein the test inputs and responses can be propagated through a path containing analog signals.</p>
Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu, "Seamless Test of Digital Components in Mixed-Signal Paths", IEEE Design & Test of Computers, vol.21, no. 1, pp. 44-55, January/February 2004, doi:10.1109/MDT.2004.1261849
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