Issue No. 01 - January/February (2004 vol. 21)
Sule Ozev , Duke University
Ismet Bayraktaroglu , Sun Microsystems
Alex Orailoglu , University of California, San Diego
<p>For today's large, mixed-signal designs, test generation requires propagating signals through digital and analog modules. This article offers an innovative seamless approach that defines a digital test methodology for digital modules wherein the test inputs and responses can be propagated through a path containing analog signals.</p>
A. Orailoglu, S. Ozev and I. Bayraktaroglu, "Seamless Test of Digital Components in Mixed-Signal Paths," in IEEE Design & Test of Computers, vol. 21, no. , pp. 44-55, 2004.