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Issue No. 01 - January/February (2004 vol. 21)
ISSN: 0740-7475
pp: 34-43
Bin-Hong Lin , Intellectual Property Library Co.
Cheng-Wen Wu , National Tsing Hua University
Hwei-Tsu Ann Luh , Taiwan Semiconductor Manufacturing Co.
<p>The Procorrelation System (PCS) obtains a high-quality correlation between die failures on a premanufactured recorded correlation wafer and the test equipment setup for the current wafer lot. PCS greatly reduces analysis time and test cost, compared with conventional full-wafer probing and offers significant benefits for deep-submicron ICs.</p>

H. A. Luh, C. Wu and B. Lin, "Efficient and Economical Test Equipment Setup Using Procorrelation," in IEEE Design & Test of Computers, vol. 21, no. , pp. 34-43, 2004.
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