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Issue No. 01 - January/February (2004 vol. 21)
ISSN: 0740-7475
pp: 34-43
Hwei-Tsu Ann Luh , Taiwan Semiconductor Manufacturing Co.
Cheng-Wen Wu , National Tsing Hua University
Bin-Hong Lin , Intellectual Property Library Co.
ABSTRACT
<p>The Procorrelation System (PCS) obtains a high-quality correlation between die failures on a premanufactured recorded correlation wafer and the test equipment setup for the current wafer lot. PCS greatly reduces analysis time and test cost, compared with conventional full-wafer probing and offers significant benefits for deep-submicron ICs.</p>
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CITATION
Hwei-Tsu Ann Luh, Cheng-Wen Wu, Bin-Hong Lin, "Efficient and Economical Test Equipment Setup Using Procorrelation", IEEE Design & Test of Computers, vol. 21, no. , pp. 34-43, January/February 2004, doi:10.1109/MDT.2004.1261848
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