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TABLE OF CONTENTS
Issue No. 05 - September/October (vol. 20)
ISSN: 0740-7475
From the EIC
Feature

Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs (HTML)

Li-C. Wang , University of California, Santa Barbara
Kenneth M. Butler , Texas Instruments
Kwang-Ting (Tim) Cheng , University of California, Santa Barbara
pp. 6-7

High-Frequency, At-Speed Scan Testing (Abstract)

Janusz Rajski , Mentor Graphics
Ron Press , Mentor Graphics
Nagesh Tamarapalli , Mentor Graphics
Bruce Swanson , Mentor Graphics
Thomas Rinderknecht , Mentor Graphics
Paul Reuter , Mentor Graphics
Xijiang Lin , Mentor Graphics
pp. 17-25

Achieving At-Speed Structural Test (Abstract)

Stephen Pateras , LogicVision
pp. 26-33
ITC Watch

ITC 2003: Breaking Test Interface Bottlenecks (Abstract)

Robert C. Aitken , Artisan Components
Gordon W. Roberts , McGill University
pp. 54

ITC Highlights (Abstract)

Gordon W. Roberts , McGill University
Robert C. Aitken , Artisan Components
pp. 55-57

Embedded Deterministic Test for Low-Cost Manufacturing (Abstract)

Nagesh Tamarapalli , Mentor Graphics
Jerzy Tyszer , Poznan University of Technology
Mark Kassab , Mentor Graphics
Nilanjan Mukherjee , Mentor Graphics
Jun Qian , Cisco Systems
Janusz Rajski , Mentor Graphics
pp. 58-66
Standards

Orthogonality of Verilog Data Types and Object Kinds (Abstract)

Jay Lawrence , Cadence Design Systems
pp. 94-96
Conference Reports

Conference Reports (Abstract)

pp. 97-99
Newsletters

DATC Newsletter (Abstract)

pp. 100

TTTC Newsletter (Abstract)

pp. 102-103
The Last Byte

All I Know I Learned at ITC (Abstract)

Scott Davidson , Sun Microsystems
pp. 104
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