Issue No. 05 - September/October (2003 vol. 20)
Alfred L. Crouch , Inovys
John C. Potter , Inovys
Jason Doege , Inovys
<p><div><em>Editor's note: </em></div>Commercial EDA tools support critical-path identification, as well as transition and path delay ATPG. But how can you narrow down the target faults or paths, and which ATPG technique should you use? The authors present a practical methodology addressing these important questions.<div><em>—Ken Butler, Texas Instruments</em></div></p>
A. L. Crouch, J. C. Potter and J. Doege, "AC Scan Path Selection for Physical Debugging," in IEEE Design & Test of Computers, vol. 20, no. , pp. 34-40, 2003.