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Issue No. 05 - September/October (2003 vol. 20)
ISSN: 0740-7475
pp: 26-33
Stephen Pateras , LogicVision
<p><div><em>Editor's note: </em></div>In addition to structural test, BIST offers an alternative low-cost approach to at-speed testing. How should BIST be implemented to address at-speed testing? What issues remain to be solved? How can we deal with multicycle paths and different frequency domains? The author describes BIST implementation techniques to answer these questions.<div><em>—Kwang-Ting Cheng, University of California, Santa Barbara</em></div></p>

S. Pateras, "Achieving At-Speed Structural Test," in IEEE Design & Test of Computers, vol. 20, no. , pp. 26-33, 2003.
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