The Community for Technology Leaders
Green Image
Issue No. 05 - September/October (2003 vol. 20)
ISSN: 0740-7475
pp: 6-7
Li-C. Wang , University of California, Santa Barbara
Kenneth M. Butler , Texas Instruments
Kwang-Ting (Tim) Cheng , University of California, Santa Barbara
INDEX TERMS
CITATION
Li-C. Wang, Kenneth M. Butler, Kwang-Ting (Tim) Cheng, "Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs", IEEE Design & Test of Computers, vol. 20, no. , pp. 6-7, September/October 2003, doi:10.1109/MDT.2003.1232250
114 ms
(Ver 3.1 (10032016))