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Issue No. 05 - September/October (2003 vol. 20)
ISSN: 0740-7475
pp: 6-7
Kenneth M. Butler , Texas Instruments
Kwang-Ting (Tim) Cheng , University of California, Santa Barbara
Li-C. Wang , University of California, Santa Barbara
INDEX TERMS
CITATION

L. Wang, K. M. Butler and K. (. Cheng, "Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs," in IEEE Design & Test of Computers, vol. 20, no. , pp. 6-7, 2003.
doi:10.1109/MDT.2003.1232250
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