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ABSTRACT
Laser fusing is a standard technique for improving yield with memory reconfiguration and repair, but implementing fusing in production can be challenging and costly. This article introduces an electrically programmable polysilicon fuse and shows how it can reduce fuse area and programming complexity.
INDEX TERMS
integrated circuit yield, built-in self test
CITATION

D. Anand et al., "An on-chip self-repair calculation and fusing methodology," in IEEE Design & Test of Computers, vol. 20, no. 5, pp. 67-75, .
doi:10.1109/MDT.2003.1232258
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