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Issue No. 04 - July/August (2003 vol. 20)
ISSN: 0740-7475
pp: 22-30
Ozgur Sinanoglu , University of California, San Diego
Alex Orailoglu , University of California, San Diego
ABSTRACT
<p>Test bandwidth allocation issues greatly limit parallel testing of SoC cores. Here, the authors propose a response compaction methodology for reducing the required output core bandwidth, enabling increased parallelism among core tests and hence reducing overall SoC test time.</p>
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CITATION

A. Orailoglu and O. Sinanoglu, "Compacting Test Responses for Deeply Embedded SoC Cores," in IEEE Design & Test of Computers, vol. 20, no. , pp. 22-30, 2003.
doi:10.1109/MDT.2003.1214349
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