Issue No. 03 - May/June (2003 vol. 20)
Alfredo Benso , Politecnico di Torino
Stefano Di Carlo , Politecnico di Torino
Giorgio Di Natale , Politecnico di Torino
Paolo Prinetto , Politecnico di Torino
<p><em>Editor?s note:</em><div>Chip-level failure detection has been a target of research for some time, but today?s very deep-submicron technology is forcing such research to move beyond detection. Repair, especially self-repair, has become very important for containing the susceptibility of today?s chips. This article introduces a self-repair solution for the digital FIR filter, one of the key blocks used in DSPs.</div><div>--Yervant Zorian, Virage Logic</div></p>
A. Benso, P. Prinetto, G. Di Natale and S. Di Carlo, "Online Self-Repair of FIR Filters," in IEEE Design & Test of Computers, vol. 20, no. , pp. 50-57, 2003.