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Issue No. 02 - March/April (2003 vol. 20)
ISSN: 0740-7475
pp: 48-55
Chien-Nan Jimmy Liu , National Chiao Tung University
I-Ling Chen , National Chiao Tung University
Jing-Yang Jou , National Chiao Tung University
<p>This technique reduces the number of required functional patterns by first defining conditions for hard-to-control (HTC) code in a hardware-description-language design and then using an algorithm to detect such code automatically. A second algorithm eliminates these HTC points by selecting a minimum number of nodes for control point insertion.</p>

J. Jou, C. J. Liu and I. Chen, "A Design-for-Verification Technique for Functional Pattern Reduction," in IEEE Design & Test of Computers, vol. 20, no. , pp. 48-55, 2003.
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