The Community for Technology Leaders
RSS Icon
Issue No.02 - March/April (2003 vol.20)
pp: 40-47
Nur Engin , Philips Research Laboratories
Hans G. Kerkhoff , MESA+ Research Institute
<p>A new method of transient fault simulation uses dc bias grouping of faulty circuits and decreases the number of Newton-Raphson iterations needed to reach a solution. An experimental tool implementing this method achieves a speedup of 20% to 30% on a flat netlist.</p>
Nur Engin, Hans G. Kerkhoff, "Fast Fault Simulation for Nonlinear Analog Circuits", IEEE Design & Test of Computers, vol.20, no. 2, pp. 40-47, March/April 2003, doi:10.1109/MDT.2003.1188261
23 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool