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Issue No. 02 - March/April (2003 vol. 20)
ISSN: 0740-7475
pp: 20-25
Bradford G. Van Treuren , Lucent Technologies
Jose M. Miranda , Lucent Technologies
<p><em>Editor?s note:</em><div>As boundary scan technology continues to mature, engineers continue tofind innovative ways of using the IEEE Std. 1149.1 facilities throughout thelife cycle of a board. Lucent Technologies is at the forefront of thisdevelopment, and the authors here describe how they have expanded theuse and reuse of the IEEE 1149.1 board tests into a variety of additional testenvironments.</div><div>--R.G. (Ben) Bennetts</div><div>Bennetts Associates</div></p>

B. G. Van Treuren and J. M. Miranda, "Embedded Boundary Scan," in IEEE Design & Test of Computers, vol. 20, no. , pp. 20-25, 2003.
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