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Issue No. 02 - March/April (2003 vol. 20)
ISSN: 0740-7475
pp: 8-18
Erik Jan Marinissen , Philips Research Laboratories
Bart Vermeulen , Philips Research Laboratories
Henk Hollmann , Philips Research Laboratories
R.G.(Ben) Bennetts , Bennetts Associates
<p><em>Editor?s note:</em><div>When testing the interconnect structures on a board, test programmers sometimes ask, How can I control the test pattern generation process to avoid ground bounce problems during Extest mode? Those wishing to satisfy a simultaneously-switching-outputs constraint will find several new solutions in this article.</div><div>--Monica Lobetti-Bodoni</div><div>Siemens Mobile Communications</div></p>
Erik Jan Marinissen, Bart Vermeulen, Henk Hollmann, R.G.(Ben) Bennetts, "Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint", IEEE Design & Test of Computers, vol. 20, no. , pp. 8-18, March/April 2003, doi:10.1109/MDT.2003.1188257
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