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Issue No. 01 - January/February (vol. 20)
ISSN: 0740-7475
EIC Message

Guest Editors' Introduction: Application-Specific Microprocessors (HTML)

Alex Veidenbaum , University of California, Irvine
Alex Orailoglu , University of California, San Diego
pp. 6-7

A 100-GOPS Programmable Processor for Vehicle Vision Systems (Abstract)

Axel Techmer , Infineon Technologies AG
Ulrich Ramacher , Infineon Technologies AG
Ulrich Hachmann , Infineon Technologies AG
Wolfgang Raab , Infineon Technologies AG
Jens Harnisch , Infineon Technologies AG
Nico Bruels , Infineon Technologies AG
Christian Sauer , Infineon Technologies AG
pp. 8-16

Application-Specific Instruction Memory Customizations for Power-Efficient Embedded Processors (Abstract)

Peter Petrov , University of California, San Diego
Alex Orailoglu , University of California, San Diego
pp. 18-25

Compilation Approach for Coarse-Grained Reconfigurable Architectures (Abstract)

Jong-eun Lee , Seoul National University
Kiyoung Choi , Seoul National University
Nikil D. Dutt , University of California, Irvine
pp. 26-33

Instruction Scheduler Generation for Retargetable Compilation (Abstract)

Rainer Leupers , Aachen University of Technology
Manuel Hohenauer , Aachen University of Technology
Heinrich Meyr , Aachen University of Technology
Oliver Wahlen , Aachen University of Technology
pp. 34-41
Special Features

Testing and Characterization of SDRAMs (Abstract)

J?erg E. Vollrath , Infineon Technologies AG
pp. 42-50

2D Test Sequence Generators (Abstract)

Grzegorz Mrugalski , Poznan University of Technology
Janusz Rajski , Mentor Graphics
Jerzy Tyszer , Poznan University of Technology
pp. 51-59

An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs (Abstract)

Andr? Ivanov , University of British Columbia
Sassan Tabatabaei , University of British Columbia
Yves Bertrand , LIRMM, University of Montpellier
Michel Renovell , LIRMM, University of Montpellier
Florence Aza? , LIRMM, University of Montpellier
pp. 60-67

Circuit-Level Considerations for Mixed-Signal Programmable Components (Abstract)

Ad?o Ant?nio de Souza Jr. , Universidade Federal do Rio Grande do Sul
Luigi Carro , Universidade Federal do Rio Grande do Sul
Marcelo Negreiros , Universidade Federal do Rio Grande do Sul
Denis Teixeira Franco , Universidade Federal do Rio Grande do Sul
Gabriel Parmegiani Jahn , Universidade Federal do Rio Grande do Sul
pp. 76-84
The Road Ahead

Error Tolerance (Abstract)

Andrew B. Kahng , University of California, San Diego
pp. 86-87
Panel Summarie

ITC 2002 Panels (Abstract)

pp. 88-90

Boundary Scan Test Standards (Abstract)

Peter J. Ashenden , Ashenden Designs
pp. 91-92
Conference Reports

DATC Newsletter (Abstract)

pp. 93

TTTC Newsletter (Abstract)

pp. 94-95
The Last Byte

Making the Best of Those Extra Transistors (Abstract)

Frank Vahid , University of California, Riverside
pp. 96
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