Issue No. 01 - January/February (2003 vol. 20)
Florence Aza? , LIRMM, University of Montpellier
Yves Bertrand , LIRMM, University of Montpellier
Michel Renovell , LIRMM, University of Montpellier
Andr? Ivanov , University of British Columbia
Sassan Tabatabaei , University of British Columbia
<p>Traditional functional testing of mixed-signal ICs is slow and requires costly, dedicated test equipment. The authors update the standard PLL architecture to allow simple digital testing. The all-digital strategy yields catastrophic fault coverage as high as that of the classical functional test, plus it is fast, extremely simple to implement, and requires only standard digital test equipment.</p>
A. Ivanov, S. Tabatabaei, Y. Bertrand, M. Renovell and F. Aza?, "An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs," in IEEE Design & Test of Computers, vol. 20, no. , pp. 60-67, 2003.