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Issue No. 01 - January/February (2003 vol. 20)
ISSN: 0740-7475
pp: 51-59
Grzegorz Mrugalski , Poznan University of Technology
Jerzy Tyszer , Poznan University of Technology
Janusz Rajski , Mentor Graphics
ABSTRACT
<p>In experiments examining test pattern generators using LFSRs with and without phase shifters as sources of 2D stimuli, generators with phase shifters consistently achieved higher hit ratios than those without them. Moreover, a new algorithm synthesizes phase shifters, minimizes linear dependencies, and highly balances the use of generator stages.</p>
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CITATION

G. Mrugalski, J. Rajski and J. Tyszer, "2D Test Sequence Generators," in IEEE Design & Test of Computers, vol. 20, no. , pp. 51-59, 2003.
doi:10.1109/MDT.2003.1173053
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