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Issue No. 01 - January/February (2003 vol. 20)
ISSN: 0740-7475
pp: 42-50
J?erg E. Vollrath , Infineon Technologies AG
ABSTRACT
<p>To improve yield and product quality, SDRAM manufacturers perform a variety of tests. A test sequence that incorporates retention tests, signal margin tests, and speed tests can help manufacturers find and repair weak memory cells.</p>
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CITATION
J?erg E. Vollrath, "Testing and Characterization of SDRAMs", IEEE Design & Test of Computers, vol. 20, no. , pp. 42-50, January/February 2003, doi:10.1109/MDT.2003.1173052
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