Issue No. 01 - January/February (2003 vol. 20)
J?erg E. Vollrath , Infineon Technologies AG
<p>To improve yield and product quality, SDRAM manufacturers perform a variety of tests. A test sequence that incorporates retention tests, signal margin tests, and speed tests can help manufacturers find and repair weak memory cells.</p>
J. E. Vollrath, "Testing and Characterization of SDRAMs," in IEEE Design & Test of Computers, vol. 20, no. , pp. 42-50, 2003.