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TABLE OF CONTENTS
Issue No. 05 - September/October (vol. 19)
ISSN: 0740-7475

I/sub DDQ/ test: will it survive the DSM challenge? (Abstract)

S.S. Sabade , Texas A&M Univ., TX, USA
D.M.H. Walker , Texas A&M Univ., TX, USA
pp. 8-16

Resistance characterization for weak open defects (Abstract)

R.R. Montanes , Philips Res. Lab., Eindhoven, Netherlands
J.P. de Gyvez , Philips Res. Lab., Eindhoven, Netherlands
pp. 18-26

Noise generation and coupling mechanisms in deep-submicron ICs (Abstract)

X. Aragones , Univ. Politecnica de Catalunya, Barcelona, Spain
J.L. Gonzalez , Univ. Politecnica de Catalunya, Barcelona, Spain
F. Moll , Univ. Politecnica de Catalunya, Barcelona, Spain
A. Rubio , Univ. Politecnica de Catalunya, Barcelona, Spain
pp. 27-35
EIC Message
Features
Special ITC Section
Special Feature
Roundtable
Conference Reports

Conference Reports (Abstract)

pp. 114-115
TTTC Newsletter

Test Technology TC Newsletter (Abstract)

pp. 116-117
DATC Newsletter
Panel Summaries
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