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ABSTRACT
<p>To screen defective dies, IDDQ tests require a reliable estimate of each die's defect-free measurement. The nearest-neighbor residual (NNR) method provides a straightforward, data-driven estimate of test measurements for improved identification of die outliers.</p>
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CITATION

W. R. Daasch, J. McNames, R. Madge and K. Cota, "Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort," in IEEE Design & Test of Computers, vol. 19, no. , pp. 74-81, 2002.
doi:10.1109/MDT.2002.1033795
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