Issue No. 05 - September/October (2002 vol. 19)
<p>A simple and highly efficient logic-simulation-based test generator uses a genetic algorithm to achieve both high fault coverage and short test generation times.</p>
S. Sheng and M. S. Hsiao, "Efficient Sequential Test Generation Based on Logic Simulation," in IEEE Design & Test of Computers, vol. 19, no. , pp. 56-64, 2002.