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Issue No. 05 - September/October (2002 vol. 19)
ISSN: 0740-7475
pp: 8-16
ABSTRACT
<p>Deep-submicron technologies pose difficultchallenges for IDDQ testing in the future. The lowthreshold voltage used by DSM devicesdecreases the defect resolution of IDDQ. However,because IDDQ is a valuable test method,researchers are working to augment IDDQ with othertest parameters to prolong its effectiveness.</p>
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CITATION
Sagar S. Sabade, D.M.H. Walker, "IDDQ Test: Will It Survive the DSM Challenge?", IEEE Design & Test of Computers, vol. 19, no. , pp. 8-16, September/October 2002, doi:10.1109/MDT.2002.1033787
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