Issue No. 05 - September/October (2002 vol. 19)
<p>Deep-submicron technologies pose difficultchallenges for IDDQ testing in the future. The lowthreshold voltage used by DSM devicesdecreases the defect resolution of IDDQ. However,because IDDQ is a valuable test method,researchers are working to augment IDDQ with othertest parameters to prolong its effectiveness.</p>
S. S. Sabade and D. Walker, "IDDQ Test: Will It Survive the DSM Challenge?," in IEEE Design & Test of Computers, vol. 19, no. , pp. 8-16, 2002.