Issue No. 04 - July/August (2002 vol. 19)
<p><i>IEEE Design & Test</i> is more than just a magazine. It represents a community a community of communities, really with technical interests in microelectronics design, design automation, and test. Once a year, these communities find a meeting ground: the Design automation Conference (DAC) for the design and design automation communities, and the International Test Conference (ITC) for the test community. This issue and the following one showcase our relationships with the DAC and ITC forums.</p>
"Building a community," in IEEE Design & Test of Computers, vol. 19, no. , pp. 3, 2002.