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Issue No. 03 - May/June (vol. 19)
ISSN: 0740-7475

Survey of low-power testing of VLSI circuits (Abstract)

P. Girard , Lab. of Informatics Robotics & Microelectron., Montpellier, France
pp. 82-92

DFT and BIST of a multichip module for high-energy physics experiments (Abstract)

A. Benso , Politecnico di Torino, Italy
S. Chiusano , Politecnico di Torino, Italy
P. Prinetto , Politecnico di Torino, Italy
pp. 94-105
EIC Message

Enabling IP (Abstract)

pp. 1
Theme Features
Special Feature
Conference Reports
DATC Newsletter

DATC Newsletter (Abstract)

pp. 117
TTTC Newsletter

TTTC Newsletter (Abstract)

pp. 118-119
The Road Ahead

Variability (Abstract)

pp. 120, 116
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