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Issue No. 03 - May/June (2002 vol. 19)
ISSN: 0740-7475
pp: 116
ABSTRACT
<p>8th International Mixed-Signal Testing Workshop</p>
INDEX TERMS
CITATION

A. Osseiran, "Conference Reports," in IEEE Design & Test of Computers, vol. 19, no. , pp. 116, 2002.
doi:10.1109/MDT.2002.10019
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