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ABSTRACT
<p>For large, complex ICs, engineers need efficient techniques for debugging first silicon. The system presented here consists of an on-chip debug infrastructure and supporting debugger software,which interacts with the infrastructure to make the chip's features accessible through a serial interface.</p>
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CITATION

B. Vermeulen and S. K. Goel, "Design for Debug: Catching Design Errors in Digital Chips," in IEEE Design & Test of Computers, vol. 19, no. , pp. 37-45, 2002.
doi:10.1109/MDT.2002.1003792
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