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Issue No. 02 - March/April (2002 vol. 19)
ISSN: 0740-7475
pp: 16-23
M. Favalli , Dept. of Eng., Ferrara Univ., Italy
ABSTRACT
Very deep-submicron technologies pose new challenges to IC testing. In particular, crosstalk and transient faults are difficult to detect with traditional methods. Online testing techniques can detect these faults, however, and a new approach extends these techniques to include gross-delay faults. Moreover, this approach described by the authors can be exploited to detect stuck-at and bridging faults offline.
INDEX TERMS
logic testing, VLSI, integrated circuit testing, crosstalk, fault location, delays, timing, automatic testing
CITATION

M. Favalli and C. Metra, "Online testing approach for very deep-submicron ICs," in IEEE Design & Test of Computers, vol. 19, no. 2, pp. 16-23, .
doi:10.1109/54.990438
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