Issue No. 02 - March/April (2002 vol. 19)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.990438
M. Favalli , Dept. of Eng., Ferrara Univ., Italy
Very deep-submicron technologies pose new challenges to IC testing. In particular, crosstalk and transient faults are difficult to detect with traditional methods. Online testing techniques can detect these faults, however, and a new approach extends these techniques to include gross-delay faults. Moreover, this approach described by the authors can be exploited to detect stuck-at and bridging faults offline.
logic testing, VLSI, integrated circuit testing, crosstalk, fault location, delays, timing, automatic testing
M. Favalli and C. Metra, "Online testing approach for very deep-submicron ICs," in IEEE Design & Test of Computers, vol. 19, no. 2, pp. 16-23, .