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Issue No. 02 - March/April (2002 vol. 19)
ISSN: 0740-7475
pp: 4-15
L.M. Silveira , Inst. Superior Tecnico, Tech. Univ. Lisbon, Portugal
ABSTRACT
The accurate modeling of noise-coupling effects caused by crosstalk through the substrate is an increasingly important concern for design and verification of analog, digital, and mixed systems. With the technique described here, designers can efficiently extract accurate substrate-coupling parameters from deep-submicron designs.
INDEX TERMS
substrates, mixed analogue-digital integrated circuits, integrated circuit testing, integrated circuit design, crosstalk
CITATION

L. Silveira and N. Vargas, "Characterizing substrate coupling in deep-submicron designs," in IEEE Design & Test of Computers, vol. 19, no. 2, pp. 4-15, .
doi:10.1109/54.990437
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