The Community for Technology Leaders
Green Image
ABSTRACT
<p>Testing multimodule systems presents several challenges, particularly when systems use submicron technology. The authors propose strategies to diagnose interconnect faults in bus-structured systems using several models.</p>
INDEX TERMS
CITATION
Fred J. Meyer, Fabrizio Lombardi, Jun Zhao, "Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems", IEEE Design & Test of Computers, vol. 19, no. , pp. 54-64, January/February 2002, doi:10.1109/54.980053
211 ms
(Ver 3.1 (10032016))