Issue No. 01 - January/February (2002 vol. 19)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.980053
<p>Testing multimodule systems presents several challenges, particularly when systems use submicron technology. The authors propose strategies to diagnose interconnect faults in bus-structured systems using several models.</p>
F. J. Meyer, F. Lombardi and J. Zhao, "Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems," in IEEE Design & Test of Computers, vol. 19, no. , pp. 54-64, 2002.