The Community for Technology Leaders
Green Image
ABSTRACT
<p>Identifying fault-embedding scan cells is a significant challenge for fault diagnosis in scan-based BIST. Deterministic partitioning techniques provide cost-effective solutions to this problem. Both mathematical solutions and simulations on hardware implementations demonstrate the effectiveness of these techniques.</p>
INDEX TERMS
CITATION
Alex Orailoglu, Ismet Bayraktaroglu, "Cost-Effective Deterministic Partitioning for Rapid Diagnosis in Scan-Based BIST", IEEE Design & Test of Computers, vol. 19, no. , pp. 42-53, January/February 2002, doi:10.1109/54.980052
87 ms
(Ver 3.1 (10032016))