Issue No. 01 - January/February (2002 vol. 19)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.980052
<p>Identifying fault-embedding scan cells is a significant challenge for fault diagnosis in scan-based BIST. Deterministic partitioning techniques provide cost-effective solutions to this problem. Both mathematical solutions and simulations on hardware implementations demonstrate the effectiveness of these techniques.</p>
A. Orailoglu and I. Bayraktaroglu, "Cost-Effective Deterministic Partitioning for Rapid Diagnosis in Scan-Based BIST," in IEEE Design & Test of Computers, vol. 19, no. , pp. 42-53, 2002.