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Issue No. 06 - November/December (2001 vol. 18)
ISSN: 0740-7475
pp: 56-62
ABSTRACT
<p>This software technique operates over a wide range of defect modes to quickly and accurately diagnose the failing latch in a defective chain without special circuitry or pattern generation.</p>
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CITATION
Kevin Stanley, "High-Accuracy Flush-and-Scan Software Diagnostic", IEEE Design & Test of Computers, vol. 18, no. , pp. 56-62, November/December 2001, doi:10.1109/54.970425
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