Issue No. 06 - November/December (2001 vol. 18)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.970425
<p>This software technique operates over a wide range of defect modes to quickly and accurately diagnose the failing latch in a defective chain without special circuitry or pattern generation.</p>
K. Stanley, "High-Accuracy Flush-and-Scan Software Diagnostic," in IEEE Design & Test of Computers, vol. 18, no. , pp. 56-62, 2001.