Issue No. 06 - November/December (2001 vol. 18)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.970423
<p>More collaboration between EDA, semiconductor, and ATE industry segments can improve the manufacturing test environment. These improvements can dramatically reduce the cost of test and lead to a new generation of DFT-aware ATE and ATE-aware DTE.</p>
T. Williams, R. Kapur and R. Chandramouli, "Strategies for Low-Cost Test," in IEEE Design & Test of Computers, vol. 18, no. , pp. 47-54, 2001.