The Community for Technology Leaders
Green Image
Issue No. 06 - November/December (2001 vol. 18)
ISSN: 0740-7475
pp: 47-54
<p>More collaboration between EDA, semiconductor, and ATE industry segments can improve the manufacturing test environment. These improvements can dramatically reduce the cost of test and lead to a new generation of DFT-aware ATE and ATE-aware DTE.</p>
Rohit Kapur, R. Chandramouli, T.W. Williams, "Strategies for Low-Cost Test", IEEE Design & Test of Computers, vol. 18, no. , pp. 47-54, November/December 2001, doi:10.1109/54.970423
80 ms
(Ver 3.3 (11022016))