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Issue No.05 - September/October (2001 vol.18)
pp: 80-91
<p>A new test-resource-partitioning approach, based on test data compression and on-chip decompression, reduces data volume, decreases testing time, and accommodates slower (less expensive) testers without decreasing test quality.</p>
Anshuman Chandra, Krishnendu Chakrabarty, "Test Resource Partitioning for SOCs", IEEE Design & Test of Computers, vol.18, no. 5, pp. 80-91, September/October 2001, doi:10.1109/54.953275
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