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Issue No. 05 - September/October (2001 vol. 18)
ISSN: 0740-7475
pp: 80-91
ABSTRACT
<p>A new test-resource-partitioning approach, based on test data compression and on-chip decompression, reduces data volume, decreases testing time, and accommodates slower (less expensive) testers without decreasing test quality.</p>
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CITATION
Krishnendu Chakrabarty, Anshuman Chandra, "Test Resource Partitioning for SOCs", IEEE Design & Test of Computers, vol. 18, no. , pp. 80-91, September/October 2001, doi:10.1109/54.953275
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