Issue No. 05 - September/October (2001 vol. 18)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.953275
<p>A new test-resource-partitioning approach, based on test data compression and on-chip decompression, reduces data volume, decreases testing time, and accommodates slower (less expensive) testers without decreasing test quality.</p>
K. Chakrabarty and A. Chandra, "Test Resource Partitioning for SOCs," in IEEE Design & Test of Computers, vol. 18, no. , pp. 80-91, 2001.