Issue No. 05 - September/October (2001 vol. 18)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.953274
<p>Using built-in self-test at the right level offers users significant cost savings, but determining which level, if any, is best for BIST can be complex. A detailed economic analysis can unravel heterogeneous costs and benefits so that designers and managers can make the right decision.</p>
L. Y. Ungar and T. Ambler, "Economics of Built-in Self-Test," in IEEE Design & Test of Computers, vol. 18, no. , pp. 70-79, 2001.