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Issue No. 05 - September/October (2001 vol. 18)
ISSN: 0740-7475
pp: 70-79
ABSTRACT
<p>Using built-in self-test at the right level offers users significant cost savings, but determining which level, if any, is best for BIST can be complex. A detailed economic analysis can unravel heterogeneous costs and benefits so that designers and managers can make the right decision.</p>
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CITATION
Louis Y. Ungar, Tony Ambler, "Economics of Built-in Self-Test", IEEE Design & Test of Computers, vol. 18, no. , pp. 70-79, September/October 2001, doi:10.1109/54.953274
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