The Community for Technology Leaders
Green Image
Issue No. 05 - September/October (2001 vol. 18)
ISSN: 0740-7475
pp: 59
INDEX TERMS
CITATION
Donald Wheater, Tony Ambler, "Test Trade-Offs Take Center Stage at ITC", IEEE Design & Test of Computers, vol. 18, no. , pp. 59, September/October 2001, doi:10.1109/MDT.2001.953272
99 ms
(Ver )