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ABSTRACT
Analyzing bitmap results can provide insight into physical failure mechanisms normally acquired only through the complex, time-consuming, and expensive process of failure analysis.
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CITATION
Alvin Jee, David Lepejian, Ben Chu, Julie Segal, "Using Electrical Bitmap Results from Embedded Memory to Enhance Yield", IEEE Design & Test of Computers, vol. 18, no. , pp. 28-39, May/June 2001, doi:10.1109/54.922801
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