Issue No. 02 - March/April (2001 vol. 18)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.914627
Current-based testing for deep-submicron VLSIs is important because of transistor sensitivity to defects as technology scales. However, unabated increases in leakage current in CMOS devices can make this testing very difficult. This article offers several solutions to this challenging problem
M. Sachdev, "Current-Based Testing for Deep-Submicron VLSIs," in IEEE Design & Test of Computers, vol. 18, no. , pp. 76-84, 2001.