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Issue No. 02 - March/April (2001 vol. 18)
ISSN: 0740-7475
pp: 76-84
ABSTRACT
Current-based testing for deep-submicron VLSIs is important because of transistor sensitivity to defects as technology scales. However, unabated increases in leakage current in CMOS devices can make this testing very difficult. This article offers several solutions to this challenging problem
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CITATION
Manoj Sachdev, "Current-Based Testing for Deep-Submicron VLSIs", IEEE Design & Test of Computers, vol. 18, no. , pp. 76-84, March/April 2001, doi:10.1109/54.914627
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