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Issue No. 01 - January/February (2001 vol. 18)
ISSN: 0740-7475
pp: 96
INDEX TERMS
CITATION
"Danger! Submicron Defects!", IEEE Design & Test of Computers, vol. 18, no. , pp. 96, January/February 2001, doi:10.1109/MDT.2001.10002
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