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Issue No. 01 - January/February (2001 vol. 18)
ISSN: 0740-7475
pp: 50-61
ABSTRACT
A IDDQ technique is proposed based on an extension of a VDDT-based method called transient signal analysis. The method, called quiescent signal analysis, uses IDDQs measured at multiple supply pins as a means of localizing defects.
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CITATION
Jim Plusquellic, "IC Diagnosis Using Multiple Supply Pad IDDQs", IEEE Design & Test of Computers, vol. 18, no. , pp. 50-61, January/February 2001, doi:10.1109/54.902822
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