Issue No. 01 - January/February (2001 vol. 18)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.902822
A IDDQ technique is proposed based on an extension of a VDDT-based method called transient signal analysis. The method, called quiescent signal analysis, uses IDDQs measured at multiple supply pins as a means of localizing defects.
Jim Plusquellic, "IC Diagnosis Using Multiple Supply Pad IDDQs", IEEE Design & Test of Computers, vol. 18, no. , pp. 50-61, January/February 2001, doi:10.1109/54.902822