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Issue No. 01 - January/February (2001 vol. 18)
ISSN: 0740-7475
pp: 42-49
ABSTRACT
IDD waveform analysis can detect defects that IDDQ testing cannot. An investigation of IDD waveform analysis methods-one based on integrators, one on fast Fourier transform-confirms that such analysis enables fault localization testing in static and dynamic CMOS circuits.
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CITATION
Khurram Muhammad, Kaushik Roy, "Fault Detection and Location Using IDD Waveform Analysis", IEEE Design & Test of Computers, vol. 18, no. , pp. 42-49, January/February 2001, doi:10.1109/54.902821
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