Issue No. 01 - January/February (2001 vol. 18)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.902821
IDD waveform analysis can detect defects that IDDQ testing cannot. An investigation of IDD waveform analysis methods-one based on integrators, one on fast Fourier transform-confirms that such analysis enables fault localization testing in static and dynamic CMOS circuits.
K. Muhammad and K. Roy, "Fault Detection and Location Using IDD Waveform Analysis," in IEEE Design & Test of Computers, vol. 18, no. , pp. 42-49, 2001.