Issue No. 01 - January/February (2001 vol. 18)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.902820
A defective-part-level model combined with a method for choosing test patterns that use site observation can predict defect levels in submicron ICs more accurately than simple stuck-at fault analysis.
B. Stewart et al., "Defect-Oriented Testing and Defective-Part-Level Prediction," in IEEE Design & Test of Computers, vol. 18, no. , pp. 31-41, 2001.