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ABSTRACT
A defective-part-level model combined with a method for choosing test patterns that use site observation can predict defect levels in submicron ICs more accurately than simple stuck-at fault analysis.
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CITATION
Bret Stewart, M. Ray Mercer, Jason D. Wicker, Jennifer Dworak, Sooryong Lee, Li-C. Wang, Kenneth M. Butler, Michael R. Grimaila, "Defect-Oriented Testing and Defective-Part-Level Prediction", IEEE Design & Test of Computers, vol. 18, no. , pp. 31-41, January/February 2001, doi:10.1109/54.902820
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