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Issue No. 04 - October-December (2000 vol. 17)
ISSN: 0740-7475
pp: 120, 119
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CITATION
Scott Davidson, "Testing in 2100", IEEE Design & Test of Computers, vol. 17, no. , pp. 120, 119, October-December 2000, doi:10.1109/MDT.2000.10029
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