Issue No. 04 - October-December (2000 vol. 17)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.895008
This paper presents a systematic methodology for microarchitecture focused postsilicon system validation in the context of IA-32 Intel microprocessors. The need for a rigorous microarchitecture focused postsilicon validation is first established after analyzing presilicon and postsilicon validation techniques that CPU manufacturers have primarily used. The proposed methodology targets microarchitectural attributes that are prioritized based on their criticality for validation to identify corner cases. Several test templates cover all the critical attributes. Each template has an algorithm covering a subset of the attributes and automatically generates many tests by parameterizing around the corner case. Examples of application of the methodology are presented. Tests based on prioritized attributes help in narrowing the search of the huge validation space for complex logic-interaction type bugs in the early phase of silicon validation. The important issues in design and deployment of such tests are described and our solutions are discussed.
H. Rotithor, "Postsilicon Validation Methodology for Microprocessors," in IEEE Design & Test of Computers, vol. 17, no. , pp. 77-88, 2000.