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ABSTRACT
The effectiveness of microarchitecture test program generation (MTPG) within the buffer-oriented microarchitecture validation (BMV) methodology is presented. A list of design errors typically encountered in industry is investigated to determine if our microarchitecture test programs can detect them. Two metrics are used to determine design error coverage: Functional deviation ( f ) is the discrepancy in coverage of our microarchitecture model when simulating the incorrect and error-free designs. Timing deviation ( t) is the discrepancy in the number of cycles needed to simulate a test program between the incorrect and error-free designs. Simulation results show that our test programs detect over 98% of the design errors based on the two detection metrics used.
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CITATION
Noppanunt Utamaphethai, R.D. Shawn Blanton, John Paul Shen, "Effectiveness of Microarchitecture Test Program Generation", IEEE Design & Test of Computers, vol. 17, no. , pp. 38-49, October-December 2000, doi:10.1109/54.895005
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