Issue No. 03 - July-September (2000 vol. 17)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.867902
<p>A cyclotron-based radiation test environment enables engineers to characterize the soft-error sensitivity of memory subsystems and assess its impact at the system level. Device/circuit modeling and simulation assist the radiation experiments in detecting device-level single-event upsets.</p>
G. S. Choi and S. H. Hwang, "A Reliability Testing Environment for Off-the-Shelf Memory Subsystems," in IEEE Design & Test of Computers, vol. 17, no. , pp. 116-124, 2000.