Issue No. 03 - July-September (2000 vol. 17)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.867901
<p>For complex mixed-signal designs, BIST is becoming a necessity. The BIST scheme presented here maximizes coverage of parametric and catastrophic failures and provides an all-digital BIST solution to analog circuits.</p>
P. N. Variyam and A. Chatterjee, "Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling," in IEEE Design & Test of Computers, vol. 17, no. , pp. 106-115, 2000.