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ABSTRACT
<p>For complex mixed-signal designs, BIST is becoming a necessity. The BIST scheme presented here maximizes coverage of parametric and catastrophic failures and provides an all-digital BIST solution to analog circuits.</p>
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CITATION

P. N. Variyam and A. Chatterjee, "Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling," in IEEE Design & Test of Computers, vol. 17, no. , pp. 106-115, 2000.
doi:10.1109/54.867901
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