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Issue No. 03 - July-September (2000 vol. 17)
ISSN: 0740-7475
pp: 18-21
ABSTRACT
<p>The monitoring of three ATPG tool parameters—fault coverage, test generation time, and test vector count—has improved test benchmarking over the years. Changing test dynamics, however, requires a different test metric.</p>
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CITATION
T.w. Williams, Cy Hay, Rohit Kapur, "The Mutating Metric for Benchmarking Test", IEEE Design & Test of Computers, vol. 17, no. , pp. 18-21, July-September 2000, doi:10.1109/54.867890
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