Issue No. 03 - July-September (2000 vol. 17)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.867890
<p>The monitoring of three ATPG tool parameters—fault coverage, test generation time, and test vector count—has improved test benchmarking over the years. Changing test dynamics, however, requires a different test metric.</p>
T. Williams, C. Hay and R. Kapur, "The Mutating Metric for Benchmarking Test," in IEEE Design & Test of Computers, vol. 17, no. , pp. 18-21, 2000.