Issue No. 02 - April-June (2000 vol. 17)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.844337
<p>Excessive "jitter," caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured—not just the jitter.</p>
J. P. Eckhardt and K. A. Jenkins, "Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops," in IEEE Design & Test of Computers, vol. 17, no. , pp. 86-93, 2000.